X-ray waveguide modes in layer structures

The interference processes, which result in the formation of the waveguide modes in layer structures of ultrathin films under conditions of total reflection of X-ray radiation (in the absence of diffraction) was studied by using a detailed analysis of the intensity distribution of a wave field in a medium provided. The experimental results obtained (X-ray reflection curves and angular dependences of the characteristic fluorescence yield) show the important role of the parameters of the individual layers of the layer structure in the wave effects. Several ways to use these effects for studying layer systems are suggested. 43 refs., 14 figs