Published November 2014
| Version v1
Journal article
High fidelity readout of a transmon qubit using a superconducting low-inductance undulatory galvanometer microwave amplifier
- 1. Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544 (United States)
- 2. Department of Physics, University of Wisconsin, Madison, Wisconsin 53706 (United States)
Description
We report high-fidelity, quantum non-demolition, single-shot readout of a superconducting transmon qubit using a dc-biased superconducting low-inductance undulatory galvanometer (SLUG) amplifier. The SLUG improves the system signal-to-noise ratio by 6.5 dB in a 20 MHz window compared with a bare high electron mobility transistor amplifier. An optimal cavity drive pulse is chosen using a genetic search algorithm, leading to a maximum combined readout and preparation fidelity of 91.9% with a measurement time of Tmeas=200 ns. Using post-selection to remove preparation errors caused by heating, we realize a combined preparation and readout fidelity of 94.3%. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1367-2630/16/11/113008Additional details
Identifiers
Publishing Information
- Journal Title
- New Journal of Physics
- Journal Volume
- 16
- Journal Issue
- 11
- Journal Page Range
- [8 p.]
- ISSN
- 1367-2630
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46055867
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALGORITHMS; DIRECT CURRENT; ELECTRON MOBILITY; GALVANOMETERS; HEATING; INDUCTANCE; MHZ RANGE 01-100; MICROWAVE AMPLIFIERS; PULSES; QUBITS; READOUT SYSTEMS; SIGNAL-TO-NOISE RATIO; SUPERCONDUCTIVITY; TRANSISTOR AMPLIFIERS
- Descriptors DEC
- AMPLIFIERS; CURRENTS; DIMENSIONLESS NUMBERS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC MEASURING INSTRUMENTS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE; INFORMATION; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MHZ RANGE; MICROWAVE EQUIPMENT; MOBILITY; PARTICLE MOBILITY; PHYSICAL PROPERTIES; QUANTUM INFORMATION