Temporal characteristic analysis of single event effects in pulse width modulator

In this paper, the nature and origin of single event effects (SEE) are studied by injecting laser pulses into different circuit blocks, combining with analysis to map pulse width modulators circuitry in the microchip die. A time-domain error-identification method is used in the temporal characteristic analysis of SEE. SEE signatures of different injection times are compared. More serious SEE are observed when the laser shot occurs on a rising edge of the device output for blocks of the error amplifier, current sense comparator, and T and SR latches. (authors)