Analytical X-ray microscopy using laboratory sources: Method and results

The implementation of X-ray imaging techniques (X-Ray Projection Microscopy or X-Ray Microtomography) for analytical purpose with laboratory equipment is not easily obtainable, due to the use of polychromatic X-ray sources. To overcome this drawback, we propose here a mathematical technique based upon the calculation of the X-ray emission spectra and the knowledge of the spectral response of the camera. For example, we show that the composition of a ternary sample can be deduced from two images measurements recorded from two primary radiation. The accuracy of the method is discussed