Published May 2002
| Version v1
Journal article
Non-linear effect on radiation damage of silicon by cluster ion bombardment
Creators
Description
Due to the spatial and temporal close proximity of cluster ion bombardment on Silicon, radiation damage of Si due to cluster ions cannot be extrapolated from that of atomic ions. In this paper we overview our recent observations of radiation damage in Si by clusters of C and Au aggregates of up to 10 atoms and 4 atoms respectively. Quantification of damage is made by RBS/channeling. We observed hyper linear radiation damage depending on cluster size. We developed a theoretical interpretation of this observation using a collision cascade overlapping model
Additional details
Identifiers
- PII
- S0168583X01013052;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 190
- Journal Issue
- 1-4
- Journal Page Range
- p. 787-791
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33067993
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CLUSTER BEAMS; ION CHANNELING; ION PAIRS; ION-ATOM COLLISIONS; NONLINEAR PROBLEMS; PHYSICAL RADIATION EFFECTS; RUTHERFORD SCATTERING; SILICON; SOLIDS
- Descriptors DEC
- ATOM COLLISIONS; BEAMS; CHANNELING; COLLISIONS; ELASTIC SCATTERING; ELEMENTS; ION COLLISIONS; RADIATION EFFECTS; SCATTERING; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.