Published May 2002 | Version v1
Journal article

Non-linear effect on radiation damage of silicon by cluster ion bombardment

Description

Due to the spatial and temporal close proximity of cluster ion bombardment on Silicon, radiation damage of Si due to cluster ions cannot be extrapolated from that of atomic ions. In this paper we overview our recent observations of radiation damage in Si by clusters of C and Au aggregates of up to 10 atoms and 4 atoms respectively. Quantification of damage is made by RBS/channeling. We observed hyper linear radiation damage depending on cluster size. We developed a theoretical interpretation of this observation using a collision cascade overlapping model

Additional details

Identifiers

PII
S0168583X01013052;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
190
Journal Issue
1-4
Journal Page Range
p. 787-791
ISSN
0168-583X
CODEN
NIMBEU

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.