Variable sample temperature scanning superconducting quantum interference device microscope
- 1. IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (United States)
- 2. Department of Applied Physics, Stanford University, Stanford, California 94305 (United States)
- 3. Ames Laboratory and Physics Department ISU, Ames, Iowa 50011 (United States)
- 4. Department of Physics, University of Oxford, Clarendon Laboratory Parks Road, Oxford OX13PU (United Kingdom)
Description
We demonstrate a design for a scanning superconducting quantum interference device (SQUID) microscope in which the sample temperature can be varied over a large range. In this design, both sample and SQUID are in the same vacuum space, separated by a few microns. By firmly anchoring the SQUID to a low-temperature bath, the sample temperature can be changed while the SQUID remains superconducting. This allows magnetic imaging at varying sample temperatures with micron-scale spatial resolution and the sensitivity of a low-Tc SQUID. We demonstrate this approach by imaging the temperature dependence of Abrikosov vortices in thin films of the high-temperature superconductor YBa2Cu3O7-δ. We extract the in-plane penetration depth λab(T) in our samples from these measurements. copyright 1999 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 74
- Journal Issue
- 26
- Journal Page Range
- p. 4011-4013
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30038664
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BARIUM COMPOUNDS; BARIUM OXIDES; COPPER OXIDES; DESIGN; HIGH-TC SUPERCONDUCTORS; MICROSCOPES; PENETRATION DEPTH; SQUID DEVICES; SUPERCONDUCTING FILMS; TEMPERATURE DEPENDENCE; VORTICES; YTTRIUM COMPOUNDS; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COPPER COMPOUNDS; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUXMETERS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; OXIDES; OXYGEN COMPOUNDS; SUPERCONDUCTING DEVICES; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS