Highly segmented thin microstrip detector with data-driven fast readout
Creators
- 1. Universita degli Studi di Trieste and INFN-Sez. di Trieste, Padriciano 99, 34012 Trieste (Italy)
Description
In September 2008 the Slim5 collaboration submitted a low material budget silicon demonstrator to test with 12 GeV/c protons, at the PS-T9 test-beam at CERN. Inside the reference telescope, two different detectors were placed as device under test (DUT). The first was a 4k-Pixel Matrix of Deep N Well MAPS, developed in a 130 nm CMOS Technology, providing digital sparsified readout. The other one was a high resistivity double sided silicon detector, with short strips at 45o angle to the detector's edge, read out by the FSSR2 chip. The FSSR2 is a 128 channel data-driven fast readout chip developed by Fermilab and INFN. In this paper we describe the main features of latter sensor, the striplet. The primary goal of the test was to measure the efficiency and the resolution of the striplets. The data-driven approach of the FSSR2 readout chips has been fully exploited by the DAQ system.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.02.181Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.02.181;
- arXiv
- arXiv:0905.0083v3;
- PII
- S0168-9002(10)00448-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 623
- Journal Issue
- 1
- Journal Page Range
- p. 159-161
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 1. international conference on technology and instrumentation in particle physics
- Dates
- 12-17 Mar 2009
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42014737
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; CERN; CHARGED PARTICLES; EFFICIENCY; EQUIPMENT; FERMILAB; GEV RANGE; PROTONS; READOUT SYSTEMS; RESOLUTION; SI SEMICONDUCTOR DETECTORS; TELESCOPES
- Descriptors DEC
- BARYONS; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HADRONS; INTERNATIONAL ORGANIZATIONS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; NUCLEONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; US DOE; US ORGANIZATIONS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.