Published November 1, 2010 | Version v1
Journal article

Highly segmented thin microstrip detector with data-driven fast readout

Creators

  • 1. Universita degli Studi di Trieste and INFN-Sez. di Trieste, Padriciano 99, 34012 Trieste (Italy)

Description

In September 2008 the Slim5 collaboration submitted a low material budget silicon demonstrator to test with 12 GeV/c protons, at the PS-T9 test-beam at CERN. Inside the reference telescope, two different detectors were placed as device under test (DUT). The first was a 4k-Pixel Matrix of Deep N Well MAPS, developed in a 130 nm CMOS Technology, providing digital sparsified readout. The other one was a high resistivity double sided silicon detector, with short strips at 45o angle to the detector's edge, read out by the FSSR2 chip. The FSSR2 is a 128 channel data-driven fast readout chip developed by Fermilab and INFN. In this paper we describe the main features of latter sensor, the striplet. The primary goal of the test was to measure the efficiency and the resolution of the striplets. The data-driven approach of the FSSR2 readout chips has been fully exploited by the DAQ system.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2010.02.181

Additional details

Identifiers

DOI
10.1016/j.nima.2010.02.181;
arXiv
arXiv:0905.0083v3;
PII
S0168-9002(10)00448-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
623
Journal Issue
1
Journal Page Range
p. 159-161
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
1. international conference on technology and instrumentation in particle physics
Dates
12-17 Mar 2009
Place
Tsukuba (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42014737
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAMS; CERN; CHARGED PARTICLES; EFFICIENCY; EQUIPMENT; FERMILAB; GEV RANGE; PROTONS; READOUT SYSTEMS; RESOLUTION; SI SEMICONDUCTOR DETECTORS; TELESCOPES
Descriptors DEC
BARYONS; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HADRONS; INTERNATIONAL ORGANIZATIONS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; NUCLEONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; US DOE; US ORGANIZATIONS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.