Published December 15, 2014 | Version v1
Journal article Metadata-only

Atomic-scale imaging correlation on the deformation and sensing mechanisms of SnO2 nanowires

Creators

  • 1. Department of Mechanical Engineering, University of South Carolina, 300 Main Street, Columbia, South Carolina 29208 (United States)
  • 2. Department of Electrical Engineering, University of South Carolina, 301 Main Street, Columbia, South Carolina 29208 (United States)
  • 3. Electron Microscopy Center, University of South Carolina, 301 Main Street, Columbia, South Carolina 29205 (United States)
  • 4. Department of Mechanical Engineering and Materials Science, University of Pittsburgh, 3700 O'Hara Street, Pittsburgh, Pennsylvania 15261 (United States)
  • 5. Department of Mechanical and Aerospace Engineering, University of Virginia, 122 Engineer's Way, Charlottesville, Virginia 22904 (United States)

Description

We demonstrate direct evidence that the strain variation induced by local lattice distortion exists in the surface layers of SnO2 nanowires by coupled scanning transmission electron microscopy and digital image correlation techniques. First-principles calculations suggest that surface reduction and subsurface oxygen vacancies account for such vigorous wavelike strain. Our study revealed that the localized change of surface atomistic configuration was responsible for the observed reduction of elastic modulus and hardness of SnO2 nanowires, as well as the superior sensing properties of SnO2 nanowire network

Additional details

Identifiers

DOI
10.1063/1.4904912;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
105
Journal Issue
24
Journal Page Range
p. 243105-243105.5
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46101245
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CORRELATIONS; CRYSTAL LATTICES; DEFORMATION; HARDNESS; IMAGES; LAYERS; NANOWIRES; OXYGEN; SCANNING ELECTRON MICROSCOPY; STRAINS; SURFACES; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; VACANCIES; VARIATIONS; YOUNG MODULUS
Descriptors DEC
CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; MECHANICAL PROPERTIES; MICROSCOPY; NANOSTRUCTURES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; TIN COMPOUNDS

Optional Information

Notes
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