Published December 1983 | Version v1
Journal article Metadata-only

X-ray investigation of H2-annealed quartz crystals

Creators

  • 1. Friedrich-Schiller-Universitaet, Jena (German Democratic Republic). Sektion Physik

Description

This paper investigates the variation of reflection properties of nearly perfect quartz crystals after annealing in H2-atmosphere. Annealing at 800 0C causes a strong distortion of the lattice structure. Double-crystal diffractometer measurements show an approximate tenfold increase of the integral reflection coefficient. The reflection properties change homogeneously over the whole crystals. (author)

Additional details

Publishing Information

Journal Title
Cryst. Res. Technol.
Journal Volume
18
Journal Issue
12
Series
Cryst. Res. Technol.
Journal Page Range
1483-1487
ISSN
0232-1300

INIS

Country of Publication
Germany
Country of Input or Organization
German Democratic Republic
INIS RN
15026188
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANNEALING; CRYSTAL STRUCTURE; HYDROGEN; IMAGES; ORIENTATION; QUARTZ; REFLECTION; TWINNING; X-RAY DIFFRACTION
Descriptors DEC
CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; HEAT TREATMENTS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SILICON OXIDES