On the lower energy limit of electronic stopping in simulated collision cascades in Ni, Pd and Pt
Creators
Description
We have investigated the effect of the choice of kinetic energy threshold Tc for electronic stopping (Se) in molecular dynamics (MD) simulations of collision cascades. We find that while the choice of Tc has only a negligible effect in low energy cascades, it has a pronounced effect on the fraction of defects found in clusters in high energy cascades. In order to gain insight into the level of energy losses expected in cascades, we have simulated a large number of cascades in Ni, Pd and Pt, with primary knock-on atom (PKA) energies between 30 eV and 200 keV. Since the energy losses affect the total atomic displacements especially in high energy cascades, we use this measure to determine a reasonable value of Tc. By directly comparing the simulated mixing efficiency to ion beam mixing experiments, we conclude that a threshold of Tc=1 eV is too low for simulations of high energy cascades in all materials considered. A value of Tc=10 eV is more realistic, although for Pd and Pt, this results in a slight over-prediction of the mixing efficiency
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2014.09.029Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2014.09.029;
- PII
- S0022-3115(14)00619-9;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 456
- Journal Page Range
- p. 99-105
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46113160
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC DISPLACEMENTS; COLLISIONS; EFFICIENCY; ENERGY LOSSES; KEV RANGE; KINETIC ENERGY; MOLECULAR DYNAMICS METHOD; SIMULATION; WASTE HEAT UTILIZATION
- Descriptors DEC
- CALCULATION METHODS; ENERGY; ENERGY RANGE; LOSSES; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; WASTE PRODUCT UTILIZATION
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.