Published January 15, 2004
| Version v1
Journal article
Field behavior of the critical current in quasi-single-crystalline YBCO films
Description
Magnetic field, angular and temperature dependencies of the critical current density were measured by SQUID-magnetometry, ac magnetic susceptibility, and transport techniques in single-crystalline epitaxial YBCO films. The mechanism of vortex depinning from growth-induced linear defects consistently quantitatively describes the measured Jc(H)-dependencies. The model takes into account a distribution of domain size as well as the dislocation spacing within domain boundaries. Structure parameters of YBCO films extracted from Jc(H parallel c,T)-curves and X-ray diffraction studies agree
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2003.09.062;
- PII
- S0921453403015363;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 401
- Journal Issue
- 1-4
- Journal Page Range
- p. 316-319
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- Topical conference on the voltage-current relation in technical superconductors
- Acronym
- International cryogenic materials conference
- Dates
- 25-28 May 2003
- Place
- Enschede (Netherlands)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37108473
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM COMPOUNDS; CRITICAL CURRENT; CUPRATES; CURRENT DENSITY; DISTRIBUTION; EDGE DISLOCATIONS; EPITAXY; HIGH-TC SUPERCONDUCTORS; MAGNETIC FIELDS; MAGNETIC SUSCEPTIBILITY; MONOCRYSTALS; SQUID DEVICES; TEMPERATURE DEPENDENCE; THIN FILMS; VORTICES; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; CRYSTALS; CURRENTS; DIFFRACTION; DISLOCATIONS; ELECTRIC CURRENTS; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUXMETERS; LINE DEFECTS; MAGNETIC PROPERTIES; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SUPERCONDUCTING DEVICES; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.