A formal presentation and comparative study of low-frequency noise reduction techniques for direct current superconducting quantum interference devices
- 1. GREYC---URA CNRS 1526, ISMRA et Universite de Caen, 6 Boulevard du Marechal Juin, 14050 Caen Cedex (France)
- 2. Thomson Sintra ASM, Route de Ste. Anne de Portzic, 29601 Brest Cedex (France)
Description
We present a comparative study of existing low-frequency noise reduction techniques for dc superconducting quantum interference devices (SQUIDS). These methods are essential to applications involving high-Tc SQUIDS because they dramatically reduce the 1/f noise to useful low-frequency noise levels. We propose a formal presentation of the problem and explain mathematically the working principles of these noise reductions methods, particularly for fluctuations arising from the critical current of the junctions. An increase in the white noise level is generally observed when a sinusoidal lock-in detection is used for these methods and we give here a mathematical explanation for this peculiar effect. Finally, noise measurements made on high-Tc grain boundary dc SQUIDS are presented; the experimental results are in close agreement with theory. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 67
- Journal Issue
- 3
- Journal Page Range
- p. 796-804.
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28032964
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; FLUCTUATIONS; FREQUENCY DEPENDENCE; GRAIN BOUNDARIES; HIGH-TC SUPERCONDUCTORS; MAGNETIC FLUX; NOISE; SQUID DEVICES
- Descriptors DEC
- CRYSTAL STRUCTURE; ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; FLUXMETERS; MEASURING INSTRUMENTS; MICROSTRUCTURE; MICROWAVE EQUIPMENT; SUPERCONDUCTING DEVICES; SUPERCONDUCTORS; VARIATIONS