Effect of combined platinum and electron on the temperature dependence of forward voltage in fast recovery diode
- 1. College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124 (China)
- 2. State Grid Smart Electrical Engineering, Beijing 100192 (China)
Description
The temperature dependences of forward voltage drop (VF) of the fast recovery diodes (FRDs) are remarkably influenced by different lifetime controlled treatments. In this paper the results of an experimental study are presented, which are the lifetime controls of platinum treatment, electron irradiation treatment, and the combined treatment of the above ones. Based on deep level transient spectroscopy (DLTS) measurements, a new level E6 (EC-0.376 eV) is found in the combined lifetime treated (CLT) sample, which is different from the levels of the individual platinum and electron irradiation ones. Comparing the tested VF results of CLT samples with the others, the level E6 is responsible for the degradation of temperature dependence of the forward voltage drop in the FRD. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/24/12/126104Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 24
- Journal Issue
- 12
- Journal Page Range
- [4 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47097032
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- DEEP LEVEL TRANSIENT SPECTROSCOPY; DIODE TUBES; ELECTRIC POTENTIAL; ELECTRONS; EV RANGE; IRRADIATION; MATERIALS RECOVERY; PLATINUM; TEMPERATURE DEPENDENCE; VOLTAGE DROP
- Descriptors DEC
- ELECTRON TUBES; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; LEPTONS; MANAGEMENT; METALS; PLATINUM METALS; PROCESSING; SPECTROSCOPY; TRANSITION ELEMENTS; WASTE MANAGEMENT; WASTE PROCESSING