Published June 1986
| Version v1
Journal article
Electron-impact ionization of Mg-like ions: S4+, Cl5+, and Ar6+
Creators
- 1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
Description
Absolute electron-impact ionization cross sections were measured as a function of collision energy for ions in the Mg-isoelectronic sequence S4+, Cl5+, and Ar6+. The measurements cover the energy range from threshold to 1500 eV and show onsets due to the indirect ionization process of inner-shell excitation followed by autoionization. The relative magnitude of the indirect ionization process increases dramatically in comparison with the direct process along the sequence, a feature which is also emphasized by earlier data for Al+
Additional details
Publishing Information
- Journal Title
- Phys. Rev., A
- Journal Volume
- 33
- Journal Issue
- 6
- Series
- Phys. Rev., A.
- Journal Page Range
- 3779-3786
- ISSN
- 0556-2791
- CODEN
- PLRAA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17070524
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ARGON IONS; AUTOIONIZATION; CHLORINE IONS; COLLIDING BEAMS; CROSS SECTIONS; ELECTRON-ION COLLISIONS; EXCITATION; IONIZATION; MULTICHARGED IONS; SULFUR IONS
- Descriptors DEC
- ATOMIC IONS; BEAMS; CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ENERGY-LEVEL TRANSITIONS; ION COLLISIONS; IONS