Published January 19, 2007 | Version v1
Journal article

A Quick and Sensitive Method of Measuring the Proportion of High-harmonic Components for Synchrotron Radiation using Ionization Chambers

  • 1. Japan Synchrotron Radiation Research Institute, Beamline Division, 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)

Description

The proportion of high-harmonic components included in monochromatized synchrotron radiation was measured with a combination of two free-air ionization chambers. The absolute intensity of the fundamental photons was measured with a chamber having a narrow gap. For the high harmonics, the intensity attenuated through a foil set to remove the fundamental component, was measured with a chamber having a wide gap and converted to the intensity before the foil considering the attenuation. The measurement result was compared with that of an Hp-Ge detector, and close agreement was obtained. Several advantages of this method over the spectrum measurement method were confirmed in the present experiment: namely, a short measuring time, adequate sensitivity even to low high-harmonic proportions and availability at low energies

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
879
Journal Issue
1
Journal Page Range
p. 1125-1128
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international conference on synchrotron radiation instrumentation
Dates
28 May - 2 Jun 2006
Place
Daegu (Korea, Republic of)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39061330
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATTENUATION; FOILS; HARMONICS; HIGH-PURITY GE DETECTORS; IONIZATION CHAMBERS; PHOTONS; SENSITIVITY; SYNCHROTRON RADIATION
Descriptors DEC
BOSONS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; GE SEMICONDUCTOR DETECTORS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; OSCILLATIONS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
(c) 2007 American Institute of Physics