A Quick and Sensitive Method of Measuring the Proportion of High-harmonic Components for Synchrotron Radiation using Ionization Chambers
- 1. Japan Synchrotron Radiation Research Institute, Beamline Division, 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)
Description
The proportion of high-harmonic components included in monochromatized synchrotron radiation was measured with a combination of two free-air ionization chambers. The absolute intensity of the fundamental photons was measured with a chamber having a narrow gap. For the high harmonics, the intensity attenuated through a foil set to remove the fundamental component, was measured with a chamber having a wide gap and converted to the intensity before the foil considering the attenuation. The measurement result was compared with that of an Hp-Ge detector, and close agreement was obtained. Several advantages of this method over the spectrum measurement method were confirmed in the present experiment: namely, a short measuring time, adequate sensitivity even to low high-harmonic proportions and availability at low energies
Additional details
Identifiers
- DOI
- 10.1063/1.2436261;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 879
- Journal Issue
- 1
- Journal Page Range
- p. 1125-1128
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 9. international conference on synchrotron radiation instrumentation
- Dates
- 28 May - 2 Jun 2006
- Place
- Daegu (Korea, Republic of)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39061330
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATTENUATION; FOILS; HARMONICS; HIGH-PURITY GE DETECTORS; IONIZATION CHAMBERS; PHOTONS; SENSITIVITY; SYNCHROTRON RADIATION
- Descriptors DEC
- BOSONS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; GE SEMICONDUCTOR DETECTORS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; OSCILLATIONS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- (c) 2007 American Institute of Physics