Published May 30, 2007
| Version v1
Journal article
Optical properties of GeSeTl thin films
Description
Using the usual melt-quenching technique, glasses with composition Ge14Se86-xTlx (x = 20%, 22%, 23.5%, 25%, 26.5% and 28%) have been obtained to prepare thin films with different thicknesses (d = 15, 30, 60, 90, 120 and 180 nm) using electron-beam evaporation. The optical gap Eg was found to decrease with increasing thallium content, x. It is found also that thicker films are accompanied with larger optical gaps. The refractive index n was found to increase with increasing Tl ratio and to decrease with increasing thickness of the films
Additional details
Identifiers
- DOI
- 10.1088/0953-8984/19/21/216209;
- PII
- S0953-8984(07)43986-8;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 19
- Journal Issue
- 21
- Journal Page Range
- p. 216209
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38077799
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CONCENTRATION RATIO; ELECTRON BEAMS; EVAPORATION; GERMANIUM; INTERMETALLIC COMPOUNDS; OPACITY; REFRACTIVE INDEX; SELENIUM; THALLIUM; THICKNESS; THIN FILMS
- Descriptors DEC
- ALLOYS; BEAMS; DIMENSIONLESS NUMBERS; DIMENSIONS; ELEMENTS; FILMS; LEPTON BEAMS; METALS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SEMIMETALS