Published May 15, 2004 | Version v1
Journal article

Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the intermediate zone between surface and volume

Description

The non-destructive and phase selective analysis of residual stresses caused by material processing in polycrystalline samples is usually performed by diffraction methods. Using X-ray and neutron probes, respectively, complementary information on the residual stress distribution in the nearest surface region and the volume of the material is available. However, there remains a gap with respect to the accessible near surface zone, which concerns a range between about 10 μm and 1 mm, where the conventional X-ray methods are no longer and the neutron methods are not yet sensitive. In order to extend the information depth to this 'intermediate' zone between the surface and the volume, use can be made of energy-dispersive (ED) diffraction in reflection geometry with photon energies up to about 100 keV. Measuring and evaluation procedures applied so far in the well-established X-ray stress analysis by means of angle-dispersive (AD) diffraction were adapted to the ED case and further developed using the advantages provided by ED diffraction. By simulations and experimental examples, the multitude of reflections recorded simultaneously in one diffracted energy spectrum will be shown to be the decisive additional parameter, which can be used for a self-consistent depth resolved triaxial residual stress gradient analysis

Additional details

Identifiers

DOI
10.1016/j.msea.2003.09.073;
PII
S0921509303009705;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
372
Journal Issue
1-2
Journal Page Range
p. 28-43
ISSN
0921-5093
CODEN
MSAPE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38073511
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
DIFFRACTION METHODS; ENERGY SPECTRA; NEUTRON PROBES; POLYCRYSTALS; RESIDUAL STRESSES; SIMULATION; STRESS ANALYSIS; X RADIATION; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; PROBES; RADIATIONS; SCATTERING; SPECTRA; STRESSES

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.