A 700 V BCD technology platform for high voltage applications
Creators
- 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)
Description
A 700 V BCD technology platform is presented for high voltage applications. An important feature is that all the devices have been realized by using a fully implanted technology in a p-type single crystal without an epitaxial or a buried layer. An economical manufacturing process, requiring only 10 masking steps, yields a broad range of MOS and bipolar components integrated on a common substrate, including 700 V nLDMOS, 200 V nLDMOS, 80 V nLDMOS, 60 V nLDMOS, 40 V nLDMOS, 700 V nJFET, and low voltage devices. A robust double RESURF nLDMOS with a breakdown voltage of 800 V and specific on-resistance of 206.2 mΩ·cm2 is successfully optimized and realized. The results of this technology are low fabrication cost, simple process and small chip area for PIC products. (semiconductor devices)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/33/4/044004Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 33
- Journal Issue
- 4
- Journal Page Range
- [4 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43108012
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BREAKDOWN; COST; ELECTRIC POTENTIAL; EPITAXY; FABRICATION; LAYERS; MANUFACTURING; MONOCRYSTALS; SEMICONDUCTOR DEVICES; SILICON OXIDES
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL GROWTH METHODS; CRYSTALS; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS