Published April 1, 2012 | Version v1
Journal article

A 700 V BCD technology platform for high voltage applications

  • 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)

Description

A 700 V BCD technology platform is presented for high voltage applications. An important feature is that all the devices have been realized by using a fully implanted technology in a p-type single crystal without an epitaxial or a buried layer. An economical manufacturing process, requiring only 10 masking steps, yields a broad range of MOS and bipolar components integrated on a common substrate, including 700 V nLDMOS, 200 V nLDMOS, 80 V nLDMOS, 60 V nLDMOS, 40 V nLDMOS, 700 V nJFET, and low voltage devices. A robust double RESURF nLDMOS with a breakdown voltage of 800 V and specific on-resistance of 206.2 mΩ·cm2 is successfully optimized and realized. The results of this technology are low fabrication cost, simple process and small chip area for PIC products. (semiconductor devices)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/33/4/044004

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
33
Journal Issue
4
Journal Page Range
[4 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43108012
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BREAKDOWN; COST; ELECTRIC POTENTIAL; EPITAXY; FABRICATION; LAYERS; MANUFACTURING; MONOCRYSTALS; SEMICONDUCTOR DEVICES; SILICON OXIDES
Descriptors DEC
CHALCOGENIDES; CRYSTAL GROWTH METHODS; CRYSTALS; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS