A detection system using drift chambers for the SPES4 spectrometer at Laboratoire National Saturne
Creators
- 1. Lyon-1 Univ., 69 - Villeurbanne (France). Inst. de Physique Nucleaire
- 2. Paris-11 Univ., 91 - Orsay (France). Inst. de Physique Nucleaire
- 3. Laboratoire National Saturne, Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France)
Description
We describe the 'drift chamber' detection setup of SPES4, the 4 GeV/c spectrometer at Laboratoire National Saturne. The particle identification is performed by combining magnetic rigidity selection with energy loss and time of flight measurements. This allows to separate analysed isotopes from Z = 1 to at least Z = 10 up to a rigidity of 4 GeV/c. A charge resolution of ΔZrms = 0.1 and a time resolution of Δtrms = 120 ps for 18Ne at about 3 GeV/c per Z are easily obtained. Two sets of multiwire drift chambers are used to measure and reconstruct the particle trajectories at the output of the system. A position resolution better than Δxrms = 160 μm can be achieved in the focal plane. This corresponds to a momentum resolution of Δδrms = 0.22 x 10-4. The performances of SPES4 (Δδrms = 2.2 x 10-4) can then be wholly exploited. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res., Sect. A
- Journal Volume
- 257
- Journal Issue
- 2
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 132-138
- ISSN
- 0168-9002
- CODEN
- NIMAE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19014103
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COUNTING CIRCUITS; DRIFT CHAMBERS; ENERGY LOSSES; ENERGY RESOLUTION; GEV RANGE 01-10; HODOSCOPES; ION DETECTION; MAGNETIC SPECTROMETERS; PARTICLE IDENTIFICATION; PLASTIC SCINTILLATION DETECTOR; RELATIVISTIC RANGE; SPATIAL RESOLUTION; TIME RESOLUTION; TIME-OF-FLIGHT METHOD; TRAJECTORIES
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ELECTRONIC CIRCUITS; ENERGY RANGE; GEV RANGE; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBER; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS; SPECTROMETERS; TIMING PROPERTIES