Effects of nitrogen concentration variation in molybdenum nitride underlayer for spin valves
Creators
- 1. School of Electronic Engineering, Soongsil University, Seoul 156-743l (Korea, Republic of)
- 2. Semiconductor Devices and Materials Lab. Korea Institute of Science and Technology, P.O. Box 131, Seoul (Korea, Republic of)
- 3. Department of Nano and Electronic Physics, Kookmin University, Seoul 136-702 (Korea, Republic of)
Description
We have studied magnetic and thermal properties of MoN films with different nitrogen concentrations. When a small amount of nitrogen is incorporated into the Mo-underlayer of a top-type spin valve, we do not observe any significant thermal degradation of its magnetic properties after annealing at 220 deg. C. The magnetoresistance ratio of the as-deposited spin-valve structure is 7.0% and slightly increases to 7.5 % even at the annealing temperature of 220 deg. C. The amount of nitrogen in the MoN underlayer seems to affect the texture growth of NiFe (1 1 1) and to improve the magnetic characteristics of the spin valve. From the XPS analysis of MoN thin films and XRD analysis of NiFe films grown on the MoN underlayer, it is concluded that spin-valve structure grown on the MoN underlayer with N2 gas-flow rate of 5 sccm is more stable than that grown with N2 gas-flow rate of 1 sccm
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2006.10.987;
- PII
- S0304-8853(06)02196-2;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 310
- Journal Issue
- 2
- Journal Page Range
- p. e977-e979
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 17. international conference on magnetism
- Dates
- 20-25 Aug 2006
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39027046
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; GAS FLOW; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MOLYBDENUM NITRIDES; NITROGEN; SPIN; TEMPERATURE RANGE 0400-1000 K; THERMAL DEGRADATION; THERMODYNAMIC PROPERTIES; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ANGULAR MOMENTUM; COHERENT SCATTERING; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; FLUID FLOW; HEAT TREATMENTS; MOLYBDENUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PARTICLE PROPERTIES; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PNICTIDES; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.