Numerical simulation of constricted and diffusive arc–anode attachments in wall-stabilized transferred argon arcs

A numerical simulation is conducted to investigate arc–anode attachment behavior, especially the formation mechanism of the constricted arc attachment mode for the water-cooled anode of wall-stabilized transferred argon arcs. Argon molecular ions and the corresponding kinetic processes are included to the finite-rate chemistry model in order to capture the chemical nonequilibrium characteristics of the arc near the anode region. Modeling results show that constricted and diffusive arc–anode attachments can be self-consistently obtained at different arc currents while keeping other parameters unchanged. The dominant kinetic processes contributing to ionization and recombination in the arc center and fringes are presented. The results show that in arc fringes and the arc attachment region, molecular ion recombination plays an important role which leads to the rapid loss of electrons. The radial evolution of the production, loss and transport processes of electrons is further analyzed. It is found that for the constricted arc attachment mode, both the recombination and convection transport caused by the anode jet result in the loss of electrons at the arc fringes, which leads to the shrinkage of the arc column at the anode. The formation of the anode jet is due to the combined action of radial and axial Lorentz forces in the anode region. (paper)