Published March 2001 | Version v1
Journal article Metadata-only

F K-edge soft X-ray absorption spectroscopy

Creators

  • 1. Department of Materials Science and Engineering, Kyoto University, Kyoto (Japan)
  • 2. The Institute of Physical and Chemical Research, Wako, Saitama (Japan)
  • 3. Synchrotron Radiation Laboratory, Institute for Solid State Physics, University of Tokyo, Tsukuba, Ibaraki (Japan)
  • 4. Institute for Solid State Physics, University of Tokyo, Kashiwa Branch, Kashiwa, Chiba (Japan)
  • 5. Hyogo Prefectural Institute of Industrial Research, Kobe, Hyogo (Japan)
  • 6. Department of Applied Chemistry, Aichi Institute of Technology, Toyota, Aichi (Japan)

Description

We measured F X-ray absorption spectra of various fluorine compounds using a synchrotron radiation at KEK-PF. The absorption spectra were measured using X-ray fluorescence yield (XFY) and total electron yield (TEY) methods. Change of the spectral shape has a relation to the metal-fluorine bond distance. By comparing with the experimental spectrum and calculated spectrum, F 2p state density is divined into up and down states. (author)

Additional details

Publishing Information

Journal Title
X-sen Bunseki No Shinpo
Journal Volume
32
Journal Page Range
p. 161-172
ISSN
0911-7806

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
32045710
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
ABSORPTION SPECTRA; BOND LENGTHS; ENERGY DEPENDENCE; EXPERIMENTAL DATA; FLUORIDES; K ABSORPTION; KEK SYNCHROTRON; SOFT X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY; YIELDS
Descriptors DEC
ABSORPTION; ACCELERATORS; CHEMICAL ANALYSIS; CYCLIC ACCELERATORS; DATA; DIMENSIONS; ELECTROMAGNETIC RADIATION; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; INFORMATION; IONIZING RADIATIONS; LENGTH; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; RADIATIONS; SORPTION; SPECTRA; SPECTROSCOPY; SYNCHROTRONS; X RADIATION; X-RAY EMISSION ANALYSIS

Optional Information

Notes
5 refs., 13 figs., 1 tab.