Finite element based evaluation of stress intensity factors for interactive semi-elliptic surface cracks
Description
A finite thickness plate with two coplanar self-same shallow and deep semi-elliptical surface cracks subjected to remote tensile surface traction is considered for fracture analysis. Based on three-dimensional (3D) finite element solutions, stress intensity factors (SIFs) are evaluated along the entire crack front using a force method. The line spring model has also been used to evaluate crack depth point SIFs using shell finite element analysis. A wide range of geometric dimensions and crack configurations viz. crack shape aspect ratio (0.3≤a/c≤1.2), crack depth ratio (1.25≤t/a≤6), relative crack location (0.33≤2c/d≤0.9) and normalized location on the crack front (0≤2phi/π≤2) are considered for numerical estimation of crack interaction factors. SIFs evaluated at the depth point using the force method from the 3D finite element results are compared with SIFs evaluated using the line spring model. Finally, using finite element results, an empirical relation is proposed for the evaluation of crack interaction factors. For the ranges considered, the proposed empirical relation predicts crack interaction factors at critical locations within ±2% of the 3D finite element solutions
Additional details
Identifiers
- DOI
- 10.1016/j.ijpvp.2003.10.003;
- PII
- S0308016103001911;
Publishing Information
- Journal Title
- International Journal of Pressure Vessels and Piping
- Journal Volume
- 80
- Journal Issue
- 12
- Journal Page Range
- p. 843-859
- ISSN
- 0308-0161
- CODEN
- PRVPAS
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36085714
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- ASPECT RATIO; CONFIGURATION; CRACKS; FINITE ELEMENT METHOD; PLATES; SHELLS; STRESS INTENSITY FACTORS; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CALCULATION METHODS; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.