Published December 2003 | Version v1
Journal article

Finite element based evaluation of stress intensity factors for interactive semi-elliptic surface cracks

Description

A finite thickness plate with two coplanar self-same shallow and deep semi-elliptical surface cracks subjected to remote tensile surface traction is considered for fracture analysis. Based on three-dimensional (3D) finite element solutions, stress intensity factors (SIFs) are evaluated along the entire crack front using a force method. The line spring model has also been used to evaluate crack depth point SIFs using shell finite element analysis. A wide range of geometric dimensions and crack configurations viz. crack shape aspect ratio (0.3≤a/c≤1.2), crack depth ratio (1.25≤t/a≤6), relative crack location (0.33≤2c/d≤0.9) and normalized location on the crack front (0≤2phi/π≤2) are considered for numerical estimation of crack interaction factors. SIFs evaluated at the depth point using the force method from the 3D finite element results are compared with SIFs evaluated using the line spring model. Finally, using finite element results, an empirical relation is proposed for the evaluation of crack interaction factors. For the ranges considered, the proposed empirical relation predicts crack interaction factors at critical locations within ±2% of the 3D finite element solutions

Additional details

Identifiers

DOI
10.1016/j.ijpvp.2003.10.003;
PII
S0308016103001911;

Publishing Information

Journal Title
International Journal of Pressure Vessels and Piping
Journal Volume
80
Journal Issue
12
Journal Page Range
p. 843-859
ISSN
0308-0161
CODEN
PRVPAS

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36085714
Subject category
S42: ENGINEERING;
Descriptors DEI
ASPECT RATIO; CONFIGURATION; CRACKS; FINITE ELEMENT METHOD; PLATES; SHELLS; STRESS INTENSITY FACTORS; THREE-DIMENSIONAL CALCULATIONS
Descriptors DEC
CALCULATION METHODS; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.