Published 1991
| Version v1
Book
Influence of surface topography on the sputtering yields of sliver
Creators
Description
no abstract available
Additional details
Publishing Information
- Publisher
- Atomic Energy Press
- Imprint Place
- Beijing (China)
- ISBN
- 7-5022-0568-3
- Imprint Title
- Shanghai institute of nuclear research academia sinica annual report (1990)
- Imprint Pagination
- 99 p.
- Journal Page Range
- p. 27
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 31007585
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- BACKSCATTERING; INCIDENCE ANGLE; KEV RANGE 10-100; MORPHOLOGY; RADIATION DOSES; RUTHERFORD SCATTERING; SCANNING ELECTRON MICROSCOPY; SILVER; SPUTTERING; SURFACES; YIELDS
- Descriptors DEC
- ELASTIC SCATTERING; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; KEV RANGE; METALS; MICROSCOPY; SCATTERING; TRANSITION ELEMENTS