Microstructural changes in irradiated silica based glasses
Creators
- 1. Modena Univ. (Italy). Ist. di Fisica
- 2. Gruppo Nazionale Struttura della Materia, Modena (Italy)
- 3. Commission of the European Communities, Ispra (Italy). Joint Research Centre
- 4. UKAEA Atomic Energy Research Establishment, Harwell. Metallurgy Div.
Description
High voltage electron microscopy studies have been performed on irradiated pure silica and borosilicate glasses to check their long-term stability when these materials are employed near high energy radioactive sources, such as in fusion reactors and during the storage of nuclear waste. The intense energetic beam of electrons produced by the Harwell 1 MeV microscope, ranging from 1017 to 1020 e/cm2/s has been focused upon specimens of various composition and impurity content at different temperatures up to about 8500C. Pure silica samples have also been bombarded with 46.5 MeV Ni+6 ions at the Variable Energy Cyclotron. It is found that while no significant changes are detectable in pure irradiated silica, clear evidence is present in complex borosilicate glasses for the growing of large defect clusters (over 1000 A, resembling gas bubbles) after electron doses of about 8.5 x 1019 e/cm2 and dose rates exceeding 2 x 1018 e/cm2/sec. Moreover, small regions, about 100 A wide, scattering electrons more than the matrix are also present. The nature of this fine microstructure has been established as a phase separation into crystalline tridymite. The observations are discussed in terms of their dependence on temperature, sample thickness, dose and dose rates. (author)
Additional details
Publishing Information
- Journal Title
- Radiat. Eff.
- Journal Volume
- 65
- Journal Issue
- 1-4
- Series
- Radiat. Eff.
- Journal Page Range
- 55-61
- ISSN
- 0033-7579
Conference
- Title
- 1. international conference on radiation effects in insulators.
- Dates
- 1981.
- Place
- Arco, Lago di Garda (Italy).
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 14727516
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BOROSILICATE GLASS; BUBBLES; CRYSTAL DEFECTS; CRYSTAL-PHASE TRANSFORMATIONS; DOSE RATES; ELECTRON MICROSCOPY; ELECTRONS; MEV RANGE 01-10; MEV RANGE 10-100; MICROSTRUCTURE; NICKEL IONS; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; SILICON OXIDES; STABILITY; TEMPERATURE DEPENDENCE
- Descriptors DEC
- ATOMIC IONS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; GLASS; IONS; LEPTONS; MEV RANGE; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; RADIATION EFFECTS; SILICON COMPOUNDS