Particle identification using CR-39 solid state nuclear track detector
Creators
- 1. University of Chinese Academy of Sciences, Beijing (China)
- 2. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai (China)
- 3. Tongji Hospital of Tongji Medical College, Huazhong University of Science and Technology, Wuhan (China)
Description
To identify a-particles and protons using CR-39 solid state nuclear track detector (CR-39 SSNTD), track growth model and interaction theory between particles and media were applied and the profile and appearance of the tracks produced by a-particles and protons on the CR-39 SSNTD were simulated. In addition, the optimal chemical etching conditions for 3 ∼ 8 MeV a-particles and 1 ∼ 9 MeV protons were calculated. The corresponding diameters, depths and the gray level values of the tracks for the optimal chemical etching conditions were simulated to identify the a-particles and protons with the same energy and different energies. To verify the simulation method, a CR-39 SSNTD was used to measure the tracks made by 5.84 MeV a-particles and 3 MeV protons. The differences between the experimental and simulated diameters of the tracks ranged between 0.36% ∼ 9.70%. For the optimal etching conditions obtained from simulation, a difference of 5.6% was observed between the experimental and simulated chemical etching time. These results are preliminary proof of the feasibility and validity of the simulation method. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Radiation Research and Radiation Processing
- Journal Volume
- 36
- Journal Issue
- 4
- Journal Page Range
- [10 p.]
- ISSN
- 1000-3436
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 54049766
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DIELECTRIC TRACK DETECTORS; ETCHING; MEV RANGE; PARTICLE IDENTIFICATION; PARTICLE TRACKS; PROTONS; SIMULATION
- Descriptors DEC
- BARYONS; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HADRONS; MEASURING INSTRUMENTS; NUCLEONS; RADIATION DETECTORS; SURFACE FINISHING
Optional Information
- Notes
- 17 figs., 3 tabs., 11 refs.; http://dx.doi.org/10.11889/j.1000-3436.2018.rrj.36.040401