Improving lithographic masks with the assistance of indentations
- 1. School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024 (China)
- 2. School of Applied Science, Taiyuan University of Science and Technology, Taiyuan 030024 (China)
Description
Indentations etched on the output surface of a metallic mask are proposed to produce fine lithographic patterns with a resolution of 500 nm using the finite-difference time domain (FDTD) method. Such a designed mask is capable of enhancing near field lithography (NFL) resolution more than three times compared with the structure without indentations. The simulation results show that the interference disturbance between the adjacent lithographic channels can be eliminated efficiently by employing the indentations. As a straightforward consequence, the channel-to-channel interspaces can be shortened significantly, maintaining a uniform field distribution and high contrast. (condensed matter: electronic structure, electrical, magnetic, and optical properties)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/21/5/057301Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 21
- Journal Issue
- 5
- Journal Page Range
- [6 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45026755
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; DESIGN; FINITE DIFFERENCE METHOD; INTERFERENCE; MASKING; METALS; RESOLUTION; SURFACES
- Descriptors DEC
- CALCULATION METHODS; ELEMENTS; EVALUATION; ITERATIVE METHODS; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION; SIMULATION