Published May 11, 2013 | Version v1
Journal article

X-ray beam-shaping via deformable mirrors: Analytical computation of the required mirror profile

  • 1. INAF/Osservatorio Astronomico di Brera, Via E. Bianchi 46, I-23807, Merate (Italy)
  • 2. Sincrotrone Trieste ScpA, S.S. 14 km 163.5 in Area Science Park, 34149 Trieste (Italy)
  • 3. IOM-CNR, S.S. 14 km 163.5 in Area Science Park, 34149 Trieste (Italy)

Description

X-ray mirrors with high focusing performances are in use in both mirror modules for X-ray telescopes and in synchrotron and FEL (Free Electron Laser) beamlines. A degradation of the focus sharpness arises in general from geometrical deformations and surface roughness, the former usually described by geometrical optics and the latter by physical optics. In general, technological developments are aimed at a very tight focusing, which requires the mirror profile to comply with the nominal shape as much as possible and to keep the roughness at a negligible level. However, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators as done at the EIS-TIMEX beamline of FERMI@Elettra. The resulting profile can be characterized with a Long Trace Profilometer and correlated with the expected optical quality via a wavefront propagation code. However, if the roughness contribution can be neglected, the computation can be performed via a ray-tracing routine, and, under opportune assumptions, the focal spot profile (the Point Spread Function, PSF) can even be predicted analytically. The advantage of this approach is that the analytical relation can be reversed; i.e., from the desired PSF the required mirror profile can be computed easily, thereby avoiding the use of complex and time-consuming numerical codes. The method can also be suited in the case of spatially inhomogeneous beam intensities, as commonly experienced at synchrotrons and FELs. In this work we expose the analytical method and the application to the beam shaping problem

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2012.10.117

Additional details

Identifiers

DOI
10.1016/j.nima.2012.10.117;
arXiv
arXiv:1301.2121v3;
PII
S0168-9002(12)01290-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
710
Journal Page Range
p. 125-130
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
4. international workshop on metrology for X-ray optics, mirror design, and fabrication
Dates
4-6 Jul 2012
Place
Barcelona (Spain)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45047660
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACTUATORS; BEAM OPTICS; BEAM PROFILES; BEAM SHAPING; CALCULATION METHODS; FREE ELECTRON LASERS; MIRRORS; ROUGHNESS; SURFACES; SYNCHROTRON RADIATION; SYNCHROTRONS; X RADIATION
Descriptors DEC
ACCELERATORS; BREMSSTRAHLUNG; CYCLIC ACCELERATORS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LASERS; RADIATIONS; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.