Published September 1, 1984
| Version v1
Journal article
Direct measurement of a VUV transition oscillator strength in xenon
Creators
- 1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
Description
A new method for accurately measuring the oscillator strengths of gases is presented. The technique is based on determining the phase-matching conditions for a laser four-wave mixing process in a gas mixture. By using high gas pressures, the measurement is independent of the detailed experimental geometry or spatial mode properties of the laser. Using the refractive index of argon as a reference, the oscillator strength of the xenon ground state to 7s[3/2]1 transition at 117.04 nm was found to be 0.098 +- 0.012. This value is more precise than previous results obtained from more complicated low-angle electron scattering experiments
Additional details
Publishing Information
- Journal Title
- AIP Conf. Proc.
- Journal Volume
- 119
- Journal Issue
- 1
- Series
- AIP Conf. Proc.
- Journal Page Range
- 363-369
- ISSN
- 0094-243X
- CODEN
- APCPC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17041361
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; FAR ULTRAVIOLET RADIATION; LIGHT SOURCES; NONLINEAR PROBLEMS; OPTICS; OSCILLATOR STRENGTHS; XENON
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; NONMETALS; RADIATION SOURCES; RADIATIONS; RARE GASES; ULTRAVIOLET RADIATION