Published 2019 | Version v1
Journal article

Retrieval of the complex-valued refractive index of germanium near the M4,5 absorption edge

  • 1. University of California, Berkeley, CA (United States)
  • 2. Advanced Research Center for Nanolithography, Amsterdam (Netherlands)
  • 3. Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Description

The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by multiangle reflectance of synchrotron radiation. The resulting index of refraction is higher resolution than previously measured values. It reveals new structures attributed to transitions from the 3d-core orbitals to the Σ5,2c and the X5,2c conduction bands. Additionally, it is shown that the problem of total external reflection, which renders multi-angle reflectance measurements insensitive to the complex-valued refractive index at grazing incidence, can be overcome by employing measurements at angles of incidence away from the critical angle.

Availability note (English)

Available from https://www.osti.gov/servlets/purl/1581347; https://www.osti.gov/biblio/1581347; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo period

Additional details

Publishing Information

Journal Title
Journal of the Optical Society of America. Part B, Optical Physics
Journal Volume
36
Journal Issue
6
Journal Page Range
p. 1716-1720
ISSN
0740-3224