Published 1985
| Version v1
Book
Vacuum ultraviolet refractive-index measurement in xenon
Creators
- 1. Oak Ridge National Lab., Chemical Physics Section, P.O. Box X, Oak Ridge, TN
Description
Although the refractive index is an important atomic property, few accurate index measurements for inert gases in the VUV region above the first allowed transition have been made. This report describes the first measurement of the refractive index of Xe gas in the negatively dispersive region from ≅115 to 117 nm
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- Conference record of the 1985 IEEE conference on lasers and electro-optics
- Journal Page Range
- p. 154.
Conference
- Title
- Conference on lasers and electro-optics.
- Dates
- 21-24 May 1985.
- Place
- Baltimore, MD (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18033503
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EXTREME ULTRAVIOLET RADIATION; FREQUENCY MIXING; GAS LASERS; GASES; OPTICAL DISPERSION; REFRACTIVE INDEX; XENON
- Descriptors DEC
- AMPLIFIERS; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; FLUIDS; LASERS; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; RARE GASES; ULTRAVIOLET RADIATION