Drag current for ionization of impurities by an electromagnetic wave in a semiconductor superlattice
Creators
- 1. Volgograd State Pedagogical University, 400013 Volgograd (Russian Federation)
Description
The drag current for ionization of a shallow impurity by a strong electromagnetic wave in a semiconductor superlattice is found. It is shown that at low temperatures, when it is possible to ignore the equilibrium carrier density, the dependence of the drag current on the intensity of the electromagnetic wave is nonlinear and it oscillates with growth of the intensity of the electromagnetic field. These oscillations are a consequence of the many-photon character of absorption of the electromagnetic wave by the impurities and also of nonparabolicity of the energy spectrum of the superlattice. A comparison is made of the contributions to the drag current from the anisotropic part of the impurity ionization probability and from its isotropic part, with allowance for modification of the distribution function by the electromagnetic wave. It is found that for (ℎ/2π)ω<<Δ (Δ is the width of the conduction miniband) the main contribution to the drag current comes from the isotropic part of the ionization probability
Additional details
Identifiers
- DOI
- 10.1134/1.1187911;
- PII
- S1063-7826(99)00912-6;
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 33
- Journal Issue
- 12
- Journal Page Range
- p. 1297-1300
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35051818
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data, Translation
- Descriptors DEI
- CRYSTAL DEFECTS; ELECTRONIC STRUCTURE; EXPERIMENTAL DATA; IONIZATION; MULTI-PHOTON PROCESSES; OPTICAL PROPERTIES; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR MATERIALS; SUPERLATTICES; THEORETICAL DATA; THIN FILMS
- Descriptors DEC
- CRYSTAL STRUCTURE; DATA; FILMS; INFORMATION; MATERIALS; NUMERICAL DATA; PHYSICAL PROPERTIES; RADIATION EFFECTS
Optional Information
- Notes
- Translated from Fizika i Tekhnika Poluprovodnikov, ISSN 0015-3222, 33, 1443-1446 (December 1999); (c) 1999 American Institute of Physics.