Published December 1999 | Version v1
Journal article

Drag current for ionization of impurities by an electromagnetic wave in a semiconductor superlattice

  • 1. Volgograd State Pedagogical University, 400013 Volgograd (Russian Federation)

Description

The drag current for ionization of a shallow impurity by a strong electromagnetic wave in a semiconductor superlattice is found. It is shown that at low temperatures, when it is possible to ignore the equilibrium carrier density, the dependence of the drag current on the intensity of the electromagnetic wave is nonlinear and it oscillates with growth of the intensity of the electromagnetic field. These oscillations are a consequence of the many-photon character of absorption of the electromagnetic wave by the impurities and also of nonparabolicity of the energy spectrum of the superlattice. A comparison is made of the contributions to the drag current from the anisotropic part of the impurity ionization probability and from its isotropic part, with allowance for modification of the distribution function by the electromagnetic wave. It is found that for (ℎ/2π)ω<<Δ (Δ is the width of the conduction miniband) the main contribution to the drag current comes from the isotropic part of the ionization probability

Additional details

Identifiers

DOI
10.1134/1.1187911;
PII
S1063-7826(99)00912-6;

Publishing Information

Journal Title
Semiconductors
Journal Volume
33
Journal Issue
12
Journal Page Range
p. 1297-1300
ISSN
1063-7826
CODEN
SMICES

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35051818
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Numerical Data, Translation
Descriptors DEI
CRYSTAL DEFECTS; ELECTRONIC STRUCTURE; EXPERIMENTAL DATA; IONIZATION; MULTI-PHOTON PROCESSES; OPTICAL PROPERTIES; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR MATERIALS; SUPERLATTICES; THEORETICAL DATA; THIN FILMS
Descriptors DEC
CRYSTAL STRUCTURE; DATA; FILMS; INFORMATION; MATERIALS; NUMERICAL DATA; PHYSICAL PROPERTIES; RADIATION EFFECTS

Optional Information

Notes
Translated from Fizika i Tekhnika Poluprovodnikov, ISSN 0015-3222, 33, 1443-1446 (December 1999); (c) 1999 American Institute of Physics.