Published November 30, 2006 | Version v1
Journal article

Simulation of CdTe:Ge crystal properties for nuclear radiation detectors

  • 1. Instituto de Microelectronica de Madrid, CNM-CSIC, c/Isaac Newton 8 (PTM), Tres Cantos 28760, Madrid (Spain)
  • 2. Instituto de Microelectronica de Barcelona, CNM-CSIC, Campus UAB, Bellaterra 08193, Barcelona (Spain)
  • 3. Instituto de Fisica de Altas Energias, Campus UAB, Bellaterra 08193, Barcelona (Spain)

Description

We report on the simulation results of the electrical properties of a coplanar detector made from Ge-doped CdTe crystals. The simulations have been performed using the commercial modeling package MEDICI. The detailed models of material behavior have been created by varying the concentration of three standard traps associated with CdTe:Ge crystals. These traps are the A-center related to Cd vacancy-residual impurity complex, the Te vacancy defect and the Ge impurity. Their energetic positions were measured by photoluminescence technique. The simulation has revealed the effects of the traps on several important detector characteristics such as leakage current and electric field distribution

Additional details

Identifiers

DOI
10.1016/j.nima.2006.06.019;
PII
S0168-9002(06)01156-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
568
Journal Issue
1
Journal Page Range
p. 451-454
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
10. European symposium on semiconductor detectors
Dates
12-16 Jun 2005
Place
Wildbad Kreuth (Germany)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.