Published November 30, 2006
| Version v1
Journal article
Simulation of CdTe:Ge crystal properties for nuclear radiation detectors
- 1. Instituto de Microelectronica de Madrid, CNM-CSIC, c/Isaac Newton 8 (PTM), Tres Cantos 28760, Madrid (Spain)
- 2. Instituto de Microelectronica de Barcelona, CNM-CSIC, Campus UAB, Bellaterra 08193, Barcelona (Spain)
- 3. Instituto de Fisica de Altas Energias, Campus UAB, Bellaterra 08193, Barcelona (Spain)
Description
We report on the simulation results of the electrical properties of a coplanar detector made from Ge-doped CdTe crystals. The simulations have been performed using the commercial modeling package MEDICI. The detailed models of material behavior have been created by varying the concentration of three standard traps associated with CdTe:Ge crystals. These traps are the A-center related to Cd vacancy-residual impurity complex, the Te vacancy defect and the Ge impurity. Their energetic positions were measured by photoluminescence technique. The simulation has revealed the effects of the traps on several important detector characteristics such as leakage current and electric field distribution
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2006.06.019;
- PII
- S0168-9002(06)01156-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 568
- Journal Issue
- 1
- Journal Page Range
- p. 451-454
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 10. European symposium on semiconductor detectors
- Dates
- 12-16 Jun 2005
- Place
- Wildbad Kreuth (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38037314
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- A CENTERS; CADMIUM TELLURIDES; CDTE SEMICONDUCTOR DETECTORS; CRYSTALS; DOPED MATERIALS; ELECTRICAL PROPERTIES; GERMANIUM; IMPURITIES; LEAKAGE CURRENT; PHOTOLUMINESCENCE; SIMULATION; TRAPS
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COLOR CENTERS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; ELEMENTS; EMISSION; LUMINESCENCE; MATERIALS; MEASURING INSTRUMENTS; METALS; PHOTON EMISSION; PHYSICAL PROPERTIES; POINT DEFECTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; TELLURIDES; TELLURIUM COMPOUNDS; VACANCIES
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.