Published October 2010 | Version v1
Journal article Metadata-only

Simulation of depth-concentration distribution for 20 keV titanium ions implanted into seed

Creators

  • 1. Physics Department, University of Science and Technology of China, Hefei (China)
  • 2. Physics Department, Xinjiang Normal Univesity, Urumqi (China)
  • 3. Physics Department, Xinjiang Normal University, Urumqi (China)
  • 4. Physics Department, Xinjiang University, Urumqi (China)

Description

A computational model for ions implanted into seed material was established according to the feature of seed using Monte Carlo method. Through revised LSS (longitudinal static stability) theory, a calculation method was proposed to simulate and calculate the depth-concentration distributions for 20 keV titanium ions implanted into peanut seed and color cotton seed respectively. Compared with computational results of TRIM program and the results of Gaussian fitting, the results of this work were most matched with experiment results. Some reasons of the differences from the calculated results and experimental results were analyzed and discussed. (authors)

Additional details

Publishing Information

Journal Title
Journal of Atomic and Molecular Physics
Journal Volume
27
Journal Issue
5
Journal Page Range
p. 954-962
ISSN
1000-0364

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
43084875
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING; S60: APPLIED LIFE SCIENCES;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
COMPARATIVE EVALUATIONS; COMPUTER CALCULATIONS; COMPUTERIZED SIMULATION; CONCENTRATION RATIO; COTTON; DEPTH; DISTRIBUTION; EXPERIMENTAL DATA; ION IMPLANTATION; MONTE CARLO METHOD; PEANUTS; SEEDS; STABILITY; T CODES; TITANIUM IONS
Descriptors DEC
CALCULATION METHODS; CHARGED PARTICLES; COMPUTER CODES; DATA; DIMENSIONLESS NUMBERS; DIMENSIONS; EVALUATION; INFORMATION; IONS; NUMERICAL DATA; SEEDS; SIMULATION

Optional Information

Notes
2 figs., 2 tabs., 30 refs.