Published February 2, 2005
| Version v1
Journal article
Surface stress oscillation in Mo(001) thin films
Creators
- 1. Department of Physics, Colorado State University, Fort Collins, CO 80523 (United States)
- 2. Department of Chemical Engineering, Colorado State University, Fort Collins, CO 80523 (United States)
Description
The surface stress was evaluated employing a composite elastic model using the first-principles full-potential linearized augmented plane-wave (FP-LAPW) method for 5, 7 and 9 monolayer (ML) Mo(001) thin films. The surface stress calculated from previously derived slope and curvature methods yields a very similar result. The surface stress is found to vary with the number of the Mo thin film layers. This variation is found to be consistent with the existence of quantum well states in these thin films
Availability note (English)
Available online at http://stacks.iop.org/0953-8984/17/581/cm5_4_002.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0953-8984/17/581/cm5_4_002.pdf; http://www.iop.org/;
- DOI
- 10.1088/0953-8984/17/4/002;
- PII
- S0953-8984(05)86256-3;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 17
- Journal Issue
- 4
- Journal Page Range
- p. 581-586
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36035480
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL STRUCTURE; LAYERS; MOLYBDENUM; OSCILLATIONS; POTENTIALS; STRESSES; SURFACES; THIN FILMS; VARIATIONS
- Descriptors DEC
- ELEMENTS; FILMS; METALS; REFRACTORY METALS; TRANSITION ELEMENTS