Tensosensitivity effect in fine-grained metallic films

The effect of tensosensitivity in crystalline and amorphous films of chromium, molybdenum and tungsten is studied. Size dependence of longitudinal and transverse tenso sensitivity coefficients is studied. The calculation of parameters characterizing temperature dependence of tensoeffect is made. The conclusion is made on considerable role of grain boundary scattering of electric current carriers causing relatively high values of tensosensitivity coefficients in fine-dispersed films and their weak dependece on the film thickness