Published February 1, 2006
| Version v1
Journal article
Rate dependence of first-order reversal curves by using a dynamic Preisach model of hysteresis
- 1. Department of Electrical and Computer Engineering, Florida State University and Florida A and M University, Tallahassee, FL 32310 (United States)
- 2. Faculty of Physics, 'Alexandru Ioan Cuza' University, Iasi, 700506 (Romania)
Description
First-order reversal curves (FORCs) are used to analyze the kinetic effects described by dynamic Preisach models of hysteresis. It is shown that dynamic processes in magnetic materials strongly affect the symmetry of FORC diagrams. The regions that are most strongly affected when the applied magnetic field varies at high speed are located in the proximity of the diagonal of the FORC diagrams. In these regions, the differential magnetic susceptibility can be negative and result into negative values of the FORC diagrams. An identification technique based on the FORC diagrams is presented for the kinetic parameters of the dynamic Preisach model
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.10.063;
- PII
- S0921-4526(05)01097-5;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 372
- Journal Issue
- 1-2
- Journal Page Range
- p. 265-268
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 5. international symposium on hysteresis and micromagnetic modeling
- Dates
- 30 May - 1 Jun 2005
- Place
- Budapest (Hungary)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37069986
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIAGRAMS; HYSTERESIS; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETIC SUSCEPTIBILITY; MATHEMATICAL MODELS; SYMMETRY; VELOCITY
- Descriptors DEC
- INFORMATION; MAGNETIC PROPERTIES; MATERIALS; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.