Published December 1976
| Version v1
Journal article
X-ray fluorescence analysis of geologic samples by means of a semiconductor detector
Description
A method for determining Cu, Zr, Nb, Mo, Sn, and W in geologic samples is presented. The X-ray fluorescence spectrum excited by a 109Cd source is resolved using a Si(Li) detector. The detection limit of the method is 10-6 gram per gram and the precision is 3 per cent
Additional details
Additional titles
- Original title (Russian)
- Рентгено-флуоресцентный анализ геологических обьектов с использованием полупроводникого детектора
Publishing Information
- Journal Title
- Isotopenpraxis
- Journal Volume
- 12
- Journal Issue
- 12
- Series
- Isotopenpraxis.
- Journal Page Range
- 480-484
Conference
- Title
- Meeting on nuclear analytic methods.
- Dates
- 12 May 1975.
- Place
- Dresden, German Democratic Republic.
INIS
- Country of Publication
- German Democratic Republic
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 8309516
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CADMIUM 109; COPPER; LI-DRIFTED SI DETECTORS; MOLYBDENUM; NIOBIUM; ORES; QUANTITATIVE CHEMICAL ANALYSIS; TIN; TUNGSTEN; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA; ZIRCONIUM
- Descriptors DEC
- BETA DECAY RADIOISOTOPES; CADMIUM ISOTOPES; CHEMICAL ANALYSIS; ELECTRON CAPTURE RADIOISOTOPES; ELEMENTS; EVEN-ODD NUCLEI; INTERMEDIATE MASS NUCLEI; ISOTOPES; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; NUCLEI; RADIATION DETECTORS; RADIOISOTOPES; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS; YEARS LIVING RADIOISOTOPES