Published 1989 | Version v1
Book Metadata-only

In situ HVEM study of ion irradiation-induced grain growth in Au thin films

Creators

  • 1. Cornell Univ., Ithaca, NY (USA). Dept. of Materials Science and Engineering
  • 2. Argonne National Lab., IL (USA)

Description

In situ observations of 1.5 MeV Xe+ ion irradiated Au films at room temperature and at 150 degrees C reveal the evolution of grain growth. The average grain size increases by the mechanisms of grain boundary migration and grain coalescence

Additional details

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (USA)
ISBN
1-55899-001-1
Imprint Title
Processing and characterization of materials using ion beams
Imprint Pagination
762 p.
Series
Materials Research Society symposium proceedings. Volume 128.
Journal Page Range
p. 297-302.

Conference

Title
Processing and characterization of materials using ion beams.
Dates
28 Nov - 2 Dec 1988.
Place
Boston, MA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21058030
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON MICROSCOPY; GOLD; GRAIN BOUNDARIES; GRAIN SIZE; ION COLLISIONS; IRRADIATION; MEV RANGE 01-10; PHYSICAL RADIATION EFFECTS; SPUTTERING; THIN FILMS; XENON IONS
Descriptors DEC
CHARGED PARTICLES; COLLISIONS; CRYSTAL STRUCTURE; ELEMENTS; ENERGY RANGE; FILMS; IONS; METALS; MEV RANGE; MICROSCOPY; MICROSTRUCTURE; RADIATION EFFECTS; SIZE; TRANSITION ELEMENTS

Optional Information

Secondary number(s)
CONF-8811225--.