Published May 1978 | Version v1
Journal article

Comparative observation of ionic migration in PbF2β and CaF2 thin films by Rutherford scattering

  • 1. Bordeaux-1 Univ., 33 - Gradignan (France). Centre d'Etudes Nucleaires

Description

Thin films of PbF2 β and CaF2, two fluoride compounds with very different ionic conductivities, have been analysed by backscattering of α-particles. For PbF2 an important variation of the fluorine, lead concentration ratios versus the film layer depth has been observed. This result corresponds to a fluorine accumulation towards the external side of the sample. This effect is less important in the case of the CaF2 films. The interpretation of the results is based on the existence of an important number of defects created by the beam, and on their motion under the influence of the surface charge due to the secondary electron emission

Abstract (French)

Des couches minces de PbF2 β et de CaF2, dont les conductivites ioniques sont tres differentes, ont ete analysees par retro-diffusion de particules α. On a pu observer, dans le cas de PbF2 une variation importante du rapport des concentrations fluor/plomb dans l'epaisseur de la couche, correspondant a une accumulation de fluor du cote du faisceau incident. Cet effet est attenue dans les couches de CaF2. L'interpretation des resultats est basee sur l'existence d'un nombre important de defauts crees par le faisceau, et sur leur deplacement sous l'effet de la charge superficielle due a l'emission secondaire d'electrons

Additional details

Additional titles

Original title (French)
Observation comparative du deplacement ionique dans les couches minces de PbF

Publishing Information

Journal Title
Rev. Phys. Appl.
Journal Volume
13
Journal Issue
5
Series
Rev. Phys. Appl.
Journal Page Range
213-218