Published October 1994 | Version v1
Miscellaneous Metadata-only

The intra-nodal capacitances of polycrystalline silicon thin film transistors. Measurement and modelling

Creators

Description

no abstract available

Availability note (English)

Available from British Library Document Supply Centre- DSC:D196737

Additional details

Publishing Information

Imprint Pagination
231 p.

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
31046170
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Thesis, Non-conventional Literature, No Abstract
Descriptors DEI
MATHEMATICAL MODELS; SILICON; TRANSISTORS
Descriptors DEC
ELEMENTS; SEMICONDUCTOR DEVICES; SEMIMETALS