Published December 2016 | Version v1
Journal article

Autonomous filling of creep cavities in Fe-Au alloys studied by synchrotron X-ray nano-tomography

  • 1. Novel Aerospace Materials Group, Faculty of Aerospace Engineering, Delft University of Technology, Kluyverweg 1, 2629 HS, Delft (Netherlands)
  • 2. Fundamental Aspects of Materials and Energy Group, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629 JB, Delft (Netherlands)
  • 3. European Synchrotron Radiation Facility, 38043, Grenoble Cedex 9 (France)
  • 4. Department of Geoscience & Engineering, Faculty of Civil Engineering and Geosciences, Stevinweg 1, 2628 CN, Delft (Netherlands)

Description

The autonomous filling of creep-loading induced grain-boundary cavities by gold-rich precipitates at a temperature of 550 °C has been studied as a function of the applied load for Fe-Au alloys using synchrotron X-ray nano-tomography. The alloy serves as a model alloy for future self-healing creep resistant steels. The size, shape and spatial distribution of cavities and precipitates are analyzed quantitatively in 3D at a nanometer resolution scale. The filling ratios for individual cavities are determined and thus a map of the filling ratio evolution is obtained. It is found that the gold-rich precipitates only form at cavity surfaces and thereby repair the creep cavity. The shape of the cavities changes from equiaxed to planar crack like morphologies as the cavities grow. The time evolution of the filling ratio is explained by a simple model considering isolated cavities as well as linked cavities. The model predictions are in good agreement with the measurements.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2016.09.023

Additional details

Identifiers

DOI
10.1016/j.actamat.2016.09.023;
PII
S1359-6454(16)30711-X;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
121
Journal Page Range
p. 352-364
ISSN
1359-6454
CODEN
ACMAFD

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.