Published October 1975 | Version v1
Journal article

Reduction of spurious background peaks in electron spectrometers

  • 1. Institut fur Grenzflachenforschung und Vakuumphysik der Kernforschungsanlage Julich GmbH, 517 Julich (Germany)

Description

Electron spectrometers working with electrostatic deflection are characterized by a typical background structure. Experimental investigations and model calculations for a 127degree analyzer show that the major part of this background is caused by specular reflections of the electrons from the deflection plates towards the exit slits. The background is reduced by a factor >10 when the deflection plates are appropriately corrugated. In a comparison with the most rational general CFF available, that of Ermer and Lifson, the most significant discrepancies found to occur are those for certain stretch--bend couplings assumed to be zero in the CFF, but shown to be appreciable by quantum calculation. It is observed that these couplings, but not the stretch--stretch couplings, are well accounted for by a steric interaction model. The ab initio cubic constants examined display the same pattern of conformity with a steric model. Bend--bend--bend and bend--bend--stretch but not all stretch--stretch--stretch interactions agree with those of the steric model. The partial success of the steric model shows that it is possible to represent a large number of interaction constants, quadratic and higher order, by a small number of parameters in molecular mechanics. The failure of the steric model to account for predominantly stretching interactions confirms that ''classical'' nonbonded interactions as embodied in conventional Urey--Bradley fields are not the only major contributors to off-diagonal force constants. An alternative model, the anharmonic model of Warshel, as augmented by Kirtman et al., was found to account well for pure stretches but not for bends or stretch--bend interactions. (authors)

Availability note (English)

Available on-line: https://doi.org/10.1063/1.1134064

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
46
Journal Issue
10
Journal Page Range
p. 1325-1328
ISSN
0034-6748

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
55092229
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
BACKGROUND NOISE; ELECTRON SPECTROMETERS; ELECTROSTATIC SPECTROMETERS; ENERGY SPECTRA; PLATES; SPACE CHARGE; SURFACES
Descriptors DEC
MEASURING INSTRUMENTS; NOISE; SPECTRA; SPECTROMETERS

Optional Information

Notes
This record replaces 07227471