Published September 29, 2005 | Version v1
Journal article

Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography

  • 1. Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw (Poland)
  • 2. Institute of Atomic Energy, 05-400 Otwock, Swierk (Poland)
  • 3. HASYLAB at DESY, Notkestr. 85, 22603 Hamburg (Germany)
  • 4. Institute of Experimental Physics, University of Warsaw, Hoza 69, 00-681 Warsaw (Poland)

Description

The GdCa4O(BO3)3 single crystals of monoclinic structure grown by the Czochralski technique were investigated by the synchrotron radiation white beam (SRWB) and conventional X-ray topography. The samples cut out parallel to the crystal growth axis b have been investigated in order to reveal the distribution of defects along the growth axis. Dislocations bundles, correlated with periodical changes of crystal diameter and large volume defects have been observed. The white beam synchrotron projection topography allowed better recognition of many details of the defect structure

Additional details

Identifiers

DOI
10.1016/j.jallcom.2005.03.084;
PII
S0925-8388(05)00393-2;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
401
Journal Issue
1-2
Journal Page Range
p. 69-74
ISSN
0925-8388
CODEN
JALCEU

Conference

Title
International conference on experimental and computing methods in high resolution diffraction applied for structure characterization of modern materials
Acronym
7. international school and symposium on synchrotron radiation in natural science; HREDAMM 2004
Dates
13-17 Jun 2004
Place
Zakopane (Poland)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.