Published February 1996 | Version v1
Journal article

Fluence dependent electron emission as a measure of surface modification induced by swift heavy ions

  • 1. Centre Interdisciplinaire de Recherches avec les Ions Lourds (CIRIL), 14 - Caen (France)
  • 2. Institut de Physique Nucleaire de Lyon, IN2P3-CNRS/Universite Claude Bernard (Lyon I), F-69622 Villeurbanne Cedex (France)
  • 3. Institut fuer Kernphysik der J.W. Goethe Universitaet, August-Euler-Strasse 6, D-60486 Frankfurt am Main (Germany)

Description

From the fluence dependence of low energy electron yields induced by swift heavy ions, one can deduce a cross section for surface transformation by electronic processes. For a clean metal surface exposed to a contaminant gas in ultrahigh vacuum, this cross section is related to the electronic desorption. In general, this cross section is also related to structural modification of the surface. The dependence of electron yields, surface transformation cross section and secondary ion yields for carbon foils show a different dependence on the electronic stopping power which is a hint for different ejection mechanisms involved. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
107
Journal Issue
1-4
Journal Page Range
p. 108-112.
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
Swift heavy ions in matter (SHIM-3).
Acronym
3. international conference
Dates
15-19 May 1995.
Place
Caen (France).