Published February 1996
| Version v1
Journal article
Fluence dependent electron emission as a measure of surface modification induced by swift heavy ions
- 1. Centre Interdisciplinaire de Recherches avec les Ions Lourds (CIRIL), 14 - Caen (France)
- 2. Institut de Physique Nucleaire de Lyon, IN2P3-CNRS/Universite Claude Bernard (Lyon I), F-69622 Villeurbanne Cedex (France)
- 3. Institut fuer Kernphysik der J.W. Goethe Universitaet, August-Euler-Strasse 6, D-60486 Frankfurt am Main (Germany)
Description
From the fluence dependence of low energy electron yields induced by swift heavy ions, one can deduce a cross section for surface transformation by electronic processes. For a clean metal surface exposed to a contaminant gas in ultrahigh vacuum, this cross section is related to the electronic desorption. In general, this cross section is also related to structural modification of the surface. The dependence of electron yields, surface transformation cross section and secondary ion yields for carbon foils show a different dependence on the electronic stopping power which is a hint for different ejection mechanisms involved. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 107
- Journal Issue
- 1-4
- Journal Page Range
- p. 108-112.
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- Swift heavy ions in matter (SHIM-3).
- Acronym
- 3. international conference
- Dates
- 15-19 May 1995.
- Place
- Caen (France).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27049996
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; CARBON IONS; COPPER IONS; DESORPTION; ELECTRON EMISSION; HEAVY IONS; MEV RANGE; MULTICHARGED IONS; OXYGEN IONS; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; SECONDARY EMISSION; STOPPING POWER; SURFACE CONTAMINATION; WORK FUNCTIONS
- Descriptors DEC
- CHARGED PARTICLES; CONTAMINATION; ELEMENTS; EMISSION; ENERGY RANGE; IONS; NONMETALS; RADIATION EFFECTS