Published November 1, 2010
| Version v1
Journal article
Temperature dependent carrier induced ferromagnetism in Zn(Fe)O and Zn(FeAl)O thin films
Creators
- 1. Department of Physics and Meteorology, Indian Institute of Technology Kharagpur, West Bengal, 721302 (India)
- 2. Department of Physics and Astronomy, University of Sheffield, Sheffield S37RH (United Kingdom)
Description
Epitaxial films of ZnO doped with magnetic ion Fe and, in some cases, with 1% Al show clear evidence of room temperature ferromagnetic ordering but containing huge amount of paramagnetic moment in it. The total ferromagnetic and paramagnetic contributions have been extracted from the low temperature SQUID measurements. A clear correlation between the magnetization per transition metal ion and the ratio of the number of carriers and number of donors have been found in these films and established the theory of carrier induced ferromagnetism. The experimental data has been best explained through the modification of electronic structure of oxide semiconductors with impurity states.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.06.085Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.06.085;
- PII
- S0169-4332(10)00918-9;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 2
- Journal Page Range
- p. 381-387
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44024187
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM ADDITIONS; CARRIERS; CORRELATIONS; DOPED MATERIALS; ELECTRONIC STRUCTURE; EPITAXY; FERROMAGNETISM; IMPURITIES; IONS; IRON ADDITIONS; MAGNETIC SEMICONDUCTORS; MAGNETIZATION; MODIFICATIONS; PARAMAGNETISM; SQUID DEVICES; TEMPERATURE DEPENDENCE; THIN FILMS; TRANSITION ELEMENTS; ZINC OXIDES
- Descriptors DEC
- ALLOYS; ALUMINIUM ALLOYS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL GROWTH METHODS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUXMETERS; IRON ALLOYS; MAGNETISM; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; OXIDES; OXYGEN COMPOUNDS; SEMICONDUCTOR MATERIALS; SUPERCONDUCTING DEVICES; TRANSITION ELEMENT ALLOYS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.