Published November 5, 2012 | Version v1
Journal article Metadata-only

What one can learn about clusters using the unique tools of x-ray photoelectron spectroscopy

Creators

  • 1. Max-lab, Lund University, Box 118, 22100 Lund (Sweden)
  • 2. Department of Physics and Astronomy, Uppsala University, Box 516, 75 120 Uppsala (Sweden)
  • 3. Department of Physics, PO Box 3000, 90014 University of Oulu (Finland)

Description

This presentation is intended to illustrate various types of collisional processes relevant for free clusters probed by x-ray photoelectron spectroscopy using our own examples ranging from free-electron-metal clusters, through half-metal and semiconductor clusters to dielectrics, the latter from van-der-Waals to ionic clusters.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/388/15/152025

Additional details

Identifiers

DOI
10.1088/1742-6596/388/15/152025;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
388
Journal Issue
15
Journal Page Range
[1 p.]
ISSN
1742-6596

Conference

Title
27. international conference on photonic, electronic and atomic collisions
Acronym
ICPEAC 2011
Dates
27 Jul - 2 Aug 2011
Place
Belfast, Northern Ireland (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44033713
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC CLUSTERS; DIELECTRIC MATERIALS; ELECTRONS; IONS; METALS; SEMICONDUCTOR MATERIALS; SEMIMETALS; VAN DER WAALS FORCES; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
CHARGED PARTICLES; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MATERIALS; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY