An overview of projectile-charge-state dependence of K-, L-, and M-shell ionization in thin solid targets for a variety of incident heavy ions up to 5.68 MeV/amu
Description
This talk will summarize most of the experiments that have been done to study the charge state dependence of inner-shell ionization in the K, L, and M shells in the thin solid targets. A study of the charge state dependence under approximate single collision conditions can provide information in regard to the Electron Capture (EC) contribution to inner-shell ionization. The EC process is expected to be more profound at lower ion velocities, v1≤v2e and for Z1≤Z2 where Z1 and Z2 are the atomic numbers of the projectile and the target atom, and v1 and v2e are the velocities of the projectile ion and the target inner-shell electron, respectively. Extended data from the authors' own laboratory over a fairly large time span as well as a variety of papers in the open literature on similar studies for selected projectiles from Z1=5 to 17 will be summarized for incident ions in the range 0.1 to 5.68 MeV/amu. The experimental data will be compared to current Coulomb ionization theories
Additional details
Publishing Information
- Publisher
- University of North Texas.
- Imprint Place
- Denton, TX (United States)
- Imprint Title
- Thirteenth international conference on the application of accelerators in research and industry
- Imprint Pagination
- 201 p.
- Journal Page Range
- p. 190c.
Conference
- Title
- 13. international conference on the application of accelerators in research and industry.
- Dates
- 7-10 Nov 1994.
- Place
- Denton, TX (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27040191
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE STATES; ELECTRON CAPTURE; ION COLLISIONS; IONIZATION; K SHELL; L SHELL; M SHELL; SOLIDS
- Descriptors DEC
- CAPTURE; COLLISIONS; ELECTRONIC STRUCTURE
Optional Information
- Secondary number(s)
- CONF-941129--.