Published January 24, 2005 | Version v1
Journal article

Density of Yang-Lee zeros and Yang-Lee edge singularity for the antiferromagnetic Ising model

  • 1. School of Computational Sciences, Korea Institute for Advanced Study, Seoul 130-722 (Korea, Republic of)

Description

The microcanonical transfer matrix is used to evaluate the exact partition function of the antiferromagnetic (AF) Ising model on LxL square lattices in an arbitrary nonzero external magnetic field at arbitrary temperature. The precise distribution of the Yang-Lee zeros in the complex x=e-2βH plane for the AF Ising model is determined as a function of temperature. Some of the Yang-Lee zeros for the AF Ising model lie on the negative real x axis, and the number of the zeros on the negative real axis is increased as temperature increases. The zeros on the negative real axis accumulate at their right end xe. In the thermodynamic limit (L->∼), the density of the zeros g(x) on the negative real axis of the AF Ising model diverges at xe for all temperatures. Therefore, the AF Ising model has the Yang-Lee edge singularity xe whose existence has been known in the ferromagnetic models only for T>Tc. For the AF Ising model the density of zeros near xe is given by g(x)∼(x-xe)-1/6, in the same way for the ferromagnetic models

Additional details

Identifiers

DOI
10.1016/j.nuclphysb.2004.10.034;
PII
S0550-3213(04)00805-3;

Publishing Information

Journal Title
Nuclear Physics. B
Journal Volume
705
Journal Issue
3
Journal Page Range
p. 504-520
ISSN
0550-3213
CODEN
NUPBBO

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36051322
Subject category
S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
Descriptors DEI
ANTIFERROMAGNETISM; DENSITY; DISTRIBUTION; ISING MODEL; MAGNETIC FIELDS; PARTITION FUNCTIONS; SINGULARITY; TEMPERATURE DEPENDENCE
Descriptors DEC
CRYSTAL MODELS; FUNCTIONS; MAGNETISM; MATHEMATICAL MODELS; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.