Published 1992
| Version v1
Book
A study od parameters that influence growth and stability of the (Bi1-x Pbx)2 Sr2 Cu3 Oy phase
Creators
- 1. Argonne National Lab., IL (United States)
- 2. American Superconductor Corp., Watertown, MA (United States)
Description
In this paper, the growth and stability of the (Bi1-xPbx)2Sr2Ca2Cu3Iy (Bi-2223) phase contained in silver-sheathed wires is investigated by a combination of x-ray diffraction, scanning electron microscopy, energy dispersive x-ray analysis, and transmission electron microscopy. Silver tubes loaded with Bi-2223 precursor powders were processed into filaments using established metallurgical techniques. The filaments were then heat-treated at selected temperatures (800 to 845 degrees C) for a range of times (10 to 6000 min) in a 7.5% oxygen atmosphere. From these studies it has been possible to investigate the time-temperature-oxygen pressure domains wherein Bi2Sr2CaCu2O8(Bi-2212) + second phases transform to Bi-2223
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-170-0
- Imprint Title
- Proceedings of layered superconductors
- Imprint Pagination
- 929 p.
- Journal Page Range
- p. 233-238.
Conference
- Title
- 1992 Material Research Society (MRS) spring meeting.
- Dates
- 27 Apr - 2 May 1992.
- Place
- San Francisco, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24026065
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BISMUTH COMPOUNDS; CHEMICAL REACTION KINETICS; CUPRATES; DIFFUSION; LATTICE PARAMETERS; OXYGEN; PHASE TRANSFORMATIONS; POWDER METALLURGY; SCANNING ELECTRON MICROSCOPY; STABILITY; SUPERCONDUCTING WIRES; SUPERCONDUCTIVITY; SUPERLATTICES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; TIME DEPENDENCE; TRANSMISSION ELECTRON MICROSCO; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; KINETICS; METALLURGY; MICROSCOPY; NONMETALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REACTION KINETICS; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; WIRES
Optional Information
- Secondary number(s)
- CONF-920402--.